Back to Search
Start Over
Modeling and measurement approaches for electrostatic discharge in semiconductor devices and ICs: an overview
- Source :
- Microelectronics Reliability; 1999, Vol. 39 Issue: 5 p579-593, 15p
- Publication Year :
- 1999
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 39
- Issue :
- 5
- Database :
- Supplemental Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Periodical
- Accession number :
- ejs2662530
- Full Text :
- https://doi.org/10.1016/S0026-2714(99)00049-9