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Analyzing the error of an approximate method for computing performance-related reliability

Authors :
Tian, Z.
Liu, P. C. K.
Lin, T.-T. Y.
Yang, S.
Source :
Microelectronics Reliability; 1996, Vol. 36 Issue: 5 p675-678, 4p
Publication Year :
1996

Details

Language :
English
ISSN :
00262714
Volume :
36
Issue :
5
Database :
Supplemental Index
Journal :
Microelectronics Reliability
Publication Type :
Periodical
Accession number :
ejs2661848
Full Text :
https://doi.org/10.1016/0026-2714(95)00138-7