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Consecutive k-out-of-n:F system with sequential failures and a single repair

Authors :
Elias, S. S.
Mokhles, N. A.
El-Sayed, E. M.
Source :
Microelectronics Reliability; 1994, Vol. 34 Issue: 1 p39-39, 1p
Publication Year :
1994

Details

Language :
English
ISSN :
00262714
Volume :
34
Issue :
1
Database :
Supplemental Index
Journal :
Microelectronics Reliability
Publication Type :
Periodical
Accession number :
ejs2661303
Full Text :
https://doi.org/10.1016/0026-2714(94)90474-X