Back to Search Start Over

Unified analytic representation of physical sputtering yield

Authors :
Janev, R. K.
Ralchenko, Y. V.
Kenmotsu, T.
Hosaka, K.
Source :
Journal of Nuclear Materials; 2001, Vol. 290 Issue: 1 p104-106, 3p
Publication Year :
2001

Details

Language :
English
ISSN :
00223115
Volume :
290
Issue :
1
Database :
Supplemental Index
Journal :
Journal of Nuclear Materials
Publication Type :
Periodical
Accession number :
ejs2619508
Full Text :
https://doi.org/10.1016/S0022-3115(00)00612-7