Oxidized silicon surfaces studied by high resolution Si 2p core-level photoelectron spectroscopy using synchrotron radiation

Details

Language :

English

ISSN :

00223093

Volume :

280

Issue :

1

Database :

Supplemental Index

Journal :

Journal of Non-Crystalline Solids

Publication Type :

Periodical

Accession number :

ejs2613006

Full Text :

https://doi.org/10.1016/S0022-3093(00)00370-7