Effect of CeO2cap layers on the preparation of YBCO films on rolling-assisted biaxially textured substrates by pulsed laser deposition

YBCO films were grown on CeO2/YSZ/CeO2buffered rolling-assisted biaxially textured substrates (RABiTS) by pulsed lased deposition (PLD). CeO2cap layer was deposited prior to YBCO growth. CeO2cap layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The microstructure and surface morphology of the films were examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). It is found that the thickness of the cap layer can remarkably affect the preparation of the subsequent YBCO layer. The possible mechanisms responsible for the dependence of the structure and the preparation of the YBCO films on the thickness of the CeO2cap layers are discussed.