Effects of texture on the properties of polycrystalline HgI2films

Due to different oriented polycrystalline HgI2films show different properties. In this paper the properties of different oriented HgI2films have been investigated by scanning electron microscopy, X-ray diffraction and current-voltage measurements. The measured results indicate HgI2films are of high quality and the properties of the (001)-oriented HgI2film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI2film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI2film keeps unchanged during measurement.