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Hartmann wave-front measurement at 13.4 nm with λ_EUV/120 accuracy

Authors :
Mercère, Pascal
Zeitoun, Philippe
Idir, Mourad
Le Pape, Sébastien
Douillet, Denis
Levecq, Xavier
Dovillaire, Guillaume
Bucourt, Samuel
Goldberg, Kenneth A.
Naulleau, Patrick P.
Rekawa, Senajith
Source :
Optics Letters; September 2003, Vol. 28 Issue: 17 p1534-1536, 3p
Publication Year :
2003

Abstract

We report, for the first time to our knowledge, experimental demonstration of wave-front analysis via the Hartmann technique in the extreme ultraviolet range. The reference wave front needed to calibrate the sensor was generated by spatially filtering a focused undulator beam with 1.7- and 0.6-μm -diameter pinholes. To fully characterize the sensor, accuracy and sensitivity measurements were performed. The incident beam’s wavelength was varied from 7 to 25 nm. Measurements of accuracy better than λ_EUV/120 (0.11 nm) were obtained at λ_EUV=13.4 nm . The aberrations introduced by an additional thin mirror, as well as wave front of the spatially unfiltered incident beam, were also measured.

Details

Language :
English
ISSN :
01469592 and 15394794
Volume :
28
Issue :
17
Database :
Supplemental Index
Journal :
Optics Letters
Publication Type :
Periodical
Accession number :
ejs20953611