Back to Search
Start Over
Bi4-xLaxTi3O12 Ferroelectric Thin Films Prepared by RF Magnetron Sputtering
- Source :
- Key Engineering Materials; February 2008, Vol. 368 Issue: 1 p109-111, 3p
- Publication Year :
- 2008
-
Abstract
- Bi4-xLaxTi3O12 (BLT) ferroelectric thin films were deposited on Pt/Si substrates by RF magnetron sputtering with Bi4-xLaxTi3O12 (x=0.5, 0.75, 1) targets with 50-mm diameter and 5-mm thickness. The effects of La contents on microstructure and ferroelectric properties of Bi4-xLaxTi3O12 thin films were investigated. The grain growth behavior and ferroelectric properties such as remanent polarization were found to be dependent on the La contents in the BLT thin films.
Details
- Language :
- English
- ISSN :
- 10139826 and 16629795
- Volume :
- 368
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Key Engineering Materials
- Publication Type :
- Periodical
- Accession number :
- ejs20060888
- Full Text :
- https://doi.org/10.4028/www.scientific.net/KEM.368-372.109