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Adsorption at liquid interfaces: A comparison of multiple experimental techniques

Authors :
Law, B. M.
Brown, M.D.
Marchand, L.
Lurio, L. B.
Hamilton, W. A.
Kuzmenko, I.
Gog, T.
Satija, S.
Watkins, E.
Majewski, J.
Source :
The European Physical Journal - Special Topics; February 2009, Vol. 167 Issue: 1 p127-132, 6p
Publication Year :
2009

Abstract

Abstract: It has proven to be a challenging task to quantitatively resolve the interfacial profile at diffuse interfaces, such as, the adsorption profile near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption profile that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry.

Details

Language :
English
ISSN :
19516355 and 19516401
Volume :
167
Issue :
1
Database :
Supplemental Index
Journal :
The European Physical Journal - Special Topics
Publication Type :
Periodical
Accession number :
ejs18300714
Full Text :
https://doi.org/10.1140/epjst/e2009-00947-2