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Effects of relaxation and phase transition on the resistivity of chemically deposited Ni66B34 layers

Authors :
Pichard, C. R.
Tosser, A. J.
Kuhnast, F. A.
Machizaud, F.
Flechon, J.
Zantout, H.
Source :
Journal of Materials Science; January 1986, Vol. 21 Issue: 1 p277-283, 7p
Publication Year :
1986

Abstract

The effects of thermal treatment on the conductivity and the temperature coefficient of resistivity of thin amorphous layers of Ni-B metallic glasses (66% Ni, 34% B) are analysed in terms of the dependence on thickness and ageing temperature. The layer exhibits a macroscopical structure consisting of clusters in an amorphous medium; it is assumed that the cluster resistivity is temperature independent up to 350° C and that the amorphous medium is altered markedly by the ageing processes. These consequences are deduced which are in agreement with a previously proposed model for a layer structure.

Details

Language :
English
ISSN :
00222461 and 15734803
Volume :
21
Issue :
1
Database :
Supplemental Index
Journal :
Journal of Materials Science
Publication Type :
Periodical
Accession number :
ejs16430160
Full Text :
https://doi.org/10.1007/BF01144732