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Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy

Authors :
Eng, L. M.
Loppacher, M. Bammerlin. Ch.
Guggisberg, M.
Bennewitz, R.
Luthi, R.
Huser, E. Meyer. Th.
Heinzelmann, H.
Guntherodt, H. -J.
Source :
Ferroelectrics; February 1999, Vol. 222 Issue: 1 p153-162, 10p
Publication Year :
1999

Abstract

Domain writing and reading on the nanometer scale is addressed with scanning force microscopy (SFM) Compared to other scanning probe methods, SFM provides broad possibilities for the on-line data controlling. i.e. three-dimensional mapping of polarisation distribution, differentiation between polarisation and topography, nanoscale domain switching of domains with a 60 nm diameter, recording of nanoscale hysteresis loops, phase transition mapping. domain wall imaging with 9 nm resolution, atomic resolution of ferroelectric surfaces, etc. All these issues are reported in this paper. The challenging result of such a concerted investigation is the possibility of using SFM for nanoscale domain writing and reading with nanometer resolution. Fig. 1 illustrates such an example where line shaped c - domains are purposely written into a ferroelectric Barium-Titanate single crystal with a 400 nm line-width. With this figure we highly appreciate and honour the work of Bob Newnham passing our best nano-wishes for his future.

Details

Language :
English
ISSN :
00150193
Volume :
222
Issue :
1
Database :
Supplemental Index
Journal :
Ferroelectrics
Publication Type :
Periodical
Accession number :
ejs12247020
Full Text :
https://doi.org/10.1080/00150199908014811