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Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films: II. Applications.

Authors :
Hirschorn, Bryan
Orazem, Mark E.
Tribollet, Bernard
Vivier, Vincent
Frateur, Isabelle
Musiani, Marco
Source :
Journal of The Electrochemical Society; 2010, Vol. 157 Issue 12, pC458-C463, 6p
Publication Year :
2010

Abstract

A normal power-law distribution of local resistivity with a uniform dielectric constant was found to be consistent with the constant-phase element (CPE). An analytic expression, based on the power-law resistivity distribution, was found that relates CPE parameters to the physical properties of a film. This expression worked well for such diverse systems as aluminum oxides, oxides on stainless steel, and human skin. Good values for film thickness were obtained, even when previously proposed expressions could not be used or yielded incorrect results. The power-law model yields a CPE impedance behavior in an appropriate frequency range, defined by two characteristic frequencies. Ideal capacitive behavior is seen above the upper characteristic frequency and below the lower characteristic frequency. A symmetric CPE response between the characteristic frequencies can be obtained by adding a parallel resistive pathway. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00134651
Volume :
157
Issue :
12
Database :
Supplemental Index
Journal :
Journal of The Electrochemical Society
Publication Type :
Academic Journal
Accession number :
64446597
Full Text :
https://doi.org/10.1149/1.3499565