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Odd-Even Effects in Charge Transport across Self-Assembled Monolayers.

Authors :
Thuo, Martin M.
Reus, William F.
Nijhuis, Christian A.
Barber, Jabulani R.
Kim, Choongik
Schulz, Michael D.
Whitesides, George M.
Source :
Journal of the American Chemical Society; 3/9/2011, Vol. 133 Issue 9, p2962-2975, 14p
Publication Year :
2011

Details

Language :
English
ISSN :
00027863
Volume :
133
Issue :
9
Database :
Supplemental Index
Journal :
Journal of the American Chemical Society
Publication Type :
Academic Journal
Accession number :
62251581
Full Text :
https://doi.org/10.1021/ja1090436