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Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.
- Source :
- Analytical Chemistry; 7/1/2010, Vol. 82 Issue 13, p5872-5877, 6p
- Publication Year :
- 2010
Details
- Language :
- English
- ISSN :
- 00032700
- Volume :
- 82
- Issue :
- 13
- Database :
- Supplemental Index
- Journal :
- Analytical Chemistry
- Publication Type :
- Academic Journal
- Accession number :
- 52249828
- Full Text :
- https://doi.org/10.1021/ac101147t