Bulge-Form Tool Design in the Precise Reclamation of a Digital Paper Display Surface.

The low yield of indium tin oxide (ITO) thin-film deposition is an important factor in optoelectronic semiconductor production. An effective reclamation process was developed that uses ultrasonic electroetching and a designed bulge-form tool to remove the defective ITO nanostructure from the optical polyethyleneterephthalate (PET) surfaces of digital paper. In the current experiment, the assistance of ultrasonics was found to be more effective than pulsed current, requiring no increase in electric power. The large length of the bulge-form tool's cathode, with a small gap width between the cathode and the workpiece, requires less time to do the same amount of ITO etching. The small end radius of the cathode, combined with enough electric power, results in very fast etching. Additionally, electric power, when combined with a fast feed rate, provides highly effective etching. A higher rate of removal of the defective ITO nanostructure corresponds to high temperature, a large electrolyte flow rate, or a high rotational speed of the electrodes. Importantly, ultrasonic electroetching with the designed bulge-form tool requires only a short period of time to remove the ITO's thin-film coatings easily and cleanly. [ABSTRACT FROM AUTHOR]