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Trade-Off between Sample Size and Accuracy: Case of Static Measurements under Interval Uncertainty.

Authors :
Siciliano, Bruno
Khatib, Oussama
Groen, Frans
Huynh, Van-Nam
Nakamori, Yoshiteru
Ono, Hiroakira
Lawry, Jonathan
Kreinovich, Vkladik
Nguyen, Hung T.
Kreinovich, Vladik
Source :
Interval / Probabilistic Uncertainty & Non-Classical Logics; 2008, p32-44, 13p
Publication Year :
2008

Abstract

In many practical situations, we are not satisfied with the accuracy of the existing measurements. There are two possible ways to improve the measurement accuracy: first, instead of a single measurement, we can make repeated measurements; the additional information coming from these additional measurements can improve the accuracy of the result of this series of measurements;second, we can replace the current measuring instrument with a more accurate one; correspondingly, we can use a more accurate (and more expensive) measurement procedure provided by a measuring lab - e.g., a procedure that includes the use of a higher quality reagent. In general, we can combine these two ways, and make repeated measurements with a more accurate measuring instrument. What is the appropriate trade-off between sample size and accuracy? This is the general problem that we address in this paper. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540776635
Database :
Supplemental Index
Journal :
Interval / Probabilistic Uncertainty & Non-Classical Logics
Publication Type :
Book
Accession number :
34018320
Full Text :
https://doi.org/10.1007/978-3-540-77664-2_4