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Robust Estimation of Reflectance Functions from Polarization.

Authors :
Hutchison, David
Kanade, Takeo
Kittler, Josef
Kleinberg, Jon M.
Mattern, Friedemann
Mitchell, John C.
Naor, Moni
Nierstrasz, Oscar
Rangan, C. Pandu
Steffen, Bernhard
Sudan, Madhu
Terzopoulos, Demetri
Tygar, Doug
Vardi, Moshe Y.
Weikum, Gerhard
Martí, Joan
Benedí, José Miguel
Mendonça, Ana Maria
Serrat, Joan
Atkinson, Gary A.
Source :
Pattern Recognition & Image Analysis (9783540728481); 2007, p363-371, 9p
Publication Year :
2007

Abstract

This paper presents a new approach to image-based reflectance function estimation. The method first uses Fresnel theory for reflection and polarization analysis to estimate the surface orientation for each image pixel from a single view. The method is confined to the case where the light source and camera lie in the same direction from the target. A 2D histogram of surface zenith angles and pixel intensities is then calculated. This histogram is processed using a robust and computationally efficient statistical analysis. Histogram data are fitted to probability density functions to deduce the reflectance function. Objects of varying complexity and material are analysed and compared to ground truth. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540728481
Database :
Supplemental Index
Journal :
Pattern Recognition & Image Analysis (9783540728481)
Publication Type :
Book
Accession number :
33215597
Full Text :
https://doi.org/10.1007/978-3-540-72849-8_46