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Advanced MOSFET Gate Dielectrics for High-Performance Microprocessors: Materials Selection and Analytical Challenges.

Authors :
Kramer, Bernhard
Kramer, B.
Zschech, E.
Engelmann, H.J.
Ohsiek, S.
Tracy, B.
Adem, E.
Robie, S.
Bernard, J.
Schmeisser, D.
Source :
Advances in Solid State Physics (9783540260417); 2005, p375-389, 15p
Publication Year :
2005

Abstract

For semiconductor industry, the challenges to future process technology and advanced materials are outlined in the International Technology Roadmap for Semiconductors (ITRS) [1]. Microelectronic and further nanoelectronic products of the next technology generations will need advanced materials particularly for device structures since the traditional shrinking of feature sizes is reaching fundamental physical limits. Currently, leading-edge microprocessor (MPU) technology is pushing material innovations in the gate stack of metal-oxide-semiconductor field effect transistors (MOSFETs). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540260417
Database :
Supplemental Index
Journal :
Advances in Solid State Physics (9783540260417)
Publication Type :
Book
Accession number :
32940510
Full Text :
https://doi.org/10.1007/11423256_30