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Authors :
Avouris, Phaedon
Bhushan, Bharat
Bimberg, Dieter
Klitzing, Klaus
Sakaki, Hiroyuki
Wiesendanger, Roland
Foster, Adam
Hofer, Werner
Source :
Scanning Probe Microscopy; 2006, p159-206, 48p
Publication Year :
2006

Abstract

In reflecting on the simulations and the gradual resolution of the puzzle, it becomes clear that only a very limited part of the whole physical situation is actually accessible in the experiments. The change of the position of the SPM tip is a result of measurements of constant-current/height contours. But the change of the position of surface atoms under given experimental conditions cannot be determined. This makes simulations the only source of information on both the stability of a system under specific conditions determined from interaction energies, the elastic limit of a surface and tip system, and the relation between true surface properties (properties of its ground state) and virtual properties that are due to the measurement itself. It might seem that the last distinction is far-fetched. But one only has to consider that atomic positions on a surface can be determined by a number of different methods, e.g., electron diffraction, photon diffraction, and electron tunneling, to understand that different experimental methods might lead to different results. And in this case, the possibility in theory to switch on or off a particular effect makes it quite adaptable to a whole range of experimental data. This becomes even more important in the case of SFM. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9780387400907
Database :
Supplemental Index
Journal :
Scanning Probe Microscopy
Publication Type :
Book
Accession number :
32939143
Full Text :
https://doi.org/10.1007/0-387-37231-8_7