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Academic Network for Microelectronic Test Education.

Authors :
Novak, F.
Biasizzo, A.
Bertrand, Yves
Flottes, Marie-Lise
Balado, L.
Figueras, J.
Di Carlo, S.
Prinetto, P.
Pricopi, N.
Wunderlich, H.-J.
Van Der Hayden, J.-P.
Source :
International Journal of Engineering Education; 2007, Vol. 23 Issue 6, p1245-1253, 9p, 1 Black and White Photograph, 1 Diagram, 3 Charts
Publication Year :
2007

Abstract

This paper is an overview of the activities performed in the framework of the European IST project EuNICE-Test (European Network for Initial and Continuing Education in VLSI/SOC Testing) using remote automatic test equipment (ATE) ), addressing the shortage of skills in the microelectronics industry in the field of electronic testing. The project was based on the experience of the common test resource centre (CRTC) for French universities. In the framework of the EuNICE-Test project, the existing network expanded to 4 new academic centres: Universitat Politècnica de Catalunya, Spain, Politecnico di Torino, Italy, University of Stuttgart, Germany and Jozef Stefan Institute Ljubljana, Slovenia. Assessments of the results achieved are presented as well as course topics anti possible future extensions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0949149X
Volume :
23
Issue :
6
Database :
Supplemental Index
Journal :
International Journal of Engineering Education
Publication Type :
Academic Journal
Accession number :
28340562