Improving the Thermal Stability of Indium Oxide n‑Type Field-Effect Transistors by Enhancing Crystallinity through Ultrahigh-Temperature Rapid Thermal Annealing.

Details

Language :

English

ISSN :

19448244

Volume :

17

Issue :

3

Database :

Supplemental Index

Journal :

ACS Applied Materials & Interfaces

Publication Type :

Academic Journal

Accession number :

182411824

Full Text :

https://doi.org/10.1021/acsami.4c18435