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Fast and Artifact-Free Excitation Multiplexing Using Synchronized Image Scanning.

Authors :
Bruggeman, Ezra
Van den Eynde, Robin
Amouroux, Baptiste
Venneman, Tom
Vanden Berghe, Pieter
Müller, Marcel
Vandenberg, Wim
Dedecker, Peter
Source :
Nano Letters; 9/11/2024, Vol. 24 Issue 36, p11141-11148, 8p
Publication Year :
2024

Details

Language :
English
ISSN :
15306984
Volume :
24
Issue :
36
Database :
Supplemental Index
Journal :
Nano Letters
Publication Type :
Academic Journal
Accession number :
179606207
Full Text :
https://doi.org/10.1021/acs.nanolett.4c00258