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Field-Driven Solid-State Defect Control of Bilayer Switching Devices.

Authors :
Defferriere, Thomas
Wang, Baoming
Klein, Julian
Ross, Frances M.
Tuller, Harry L.
Source :
ACS Applied Materials & Interfaces; 9/4/2024, Vol. 216 Issue 35, p46461-46472, 12p
Publication Year :
2024

Details

Language :
English
ISSN :
19448244
Volume :
216
Issue :
35
Database :
Supplemental Index
Journal :
ACS Applied Materials & Interfaces
Publication Type :
Academic Journal
Accession number :
179461176
Full Text :
https://doi.org/10.1021/acsami.4c09826