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Imaging Negative Charge around Single Vanadium Dopant Atoms in Monolayer Tungsten Diselenide Using 4D Scanning Transmission Electron Microscopy.
- Source :
- ACS Nano; 8/27/2024, Vol. 18 Issue 34, p23354-23364, 11p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 19360851
- Volume :
- 18
- Issue :
- 34
- Database :
- Supplemental Index
- Journal :
- ACS Nano
- Publication Type :
- Academic Journal
- Accession number :
- 179292908
- Full Text :
- https://doi.org/10.1021/acsnano.4c06561