Back to Search
Start Over
Large-Scale Statistical Analysis of Defect Emission in hBN: Revealing Spectral Families and Influence of Flake Morphology.
- Source :
- ACS Nano; 8/13/2024, Vol. 18 Issue 32, p20980-20989, 10p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 19360851
- Volume :
- 18
- Issue :
- 32
- Database :
- Supplemental Index
- Journal :
- ACS Nano
- Publication Type :
- Academic Journal
- Accession number :
- 179020627
- Full Text :
- https://doi.org/10.1021/acsnano.3c10403