Back to Search Start Over

Integrated metrology for advanced manufacturing.

Authors :
Archenti, Andreas
Gao, Wei
Donmez, Alkan
Savio, Enrico
Irino, Naruhiro
Source :
CIRP Annals - Manufacturing Technology; 2024, Vol. 73 Issue 2, p639-665, 27p
Publication Year :
2024

Abstract

The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00078506
Volume :
73
Issue :
2
Database :
Supplemental Index
Journal :
CIRP Annals - Manufacturing Technology
Publication Type :
Academic Journal
Accession number :
178975100
Full Text :
https://doi.org/10.1016/j.cirp.2024.05.003