Nondefective Vacancy Enhanced Resistive Switching Reliability in Emergent van der Waals Metal Phosphorus Trisulfide-Based Memristive In-Memory Computing Hardware.

Details

Language :

English

ISSN :

15306984

Volume :

24

Issue :

26

Database :

Supplemental Index

Journal :

Nano Letters

Publication Type :

Academic Journal

Accession number :

178314871

Full Text :

https://doi.org/10.1021/acs.nanolett.4c00212