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High-Temperature Atomic Layer Deposition of Rutile TiO2 Films on RuO2 Substrates: Interfacial Reactions and Dielectric Performance.

Authors :
Jeon, Jihoon
Kim, Taikyu
Jang, Myoungsu
Chung, Hong Keun
Kim, Sung-Chul
Won, Sung Ok
Park, Yongjoo
Choi, Byung Joon
Chung, Yoon Jang
Kim, Seong Keun
Source :
Chemistry of Materials; 4/9/2024, Vol. 36 Issue 7, p3326-3333, 8p
Publication Year :
2024

Details

Language :
English
ISSN :
08974756
Volume :
36
Issue :
7
Database :
Supplemental Index
Journal :
Chemistry of Materials
Publication Type :
Academic Journal
Accession number :
176561020
Full Text :
https://doi.org/10.1021/acs.chemmater.3c03324