Quantification of Crystalline Phases in Hf0.5Zr0.5O2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations.

Details

Language :

English

ISSN :

19448244

Volume :

16

Issue :

3

Database :

Supplemental Index

Journal :

ACS Applied Materials & Interfaces

Publication Type :

Academic Journal

Accession number :

175028529

Full Text :

https://doi.org/10.1021/acsami.3c13848