Coherent X‑ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth.

MLA

Myint, Peco, et al. “Coherent X‑ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth.” ACS Nano, vol. 18, no. 3, Jan. 2024, pp. 1982–94. EBSCOhost, https://doi.org/10.1021/acsnano.3c07619.

APA

Myint, P., Woodward, J. M., Wang, C., Zhang, X., Wiegart, L., Fluerasu, A., Headrick, R. L., Eddy Jr., C. R., & Ludwig Jr., K. F. (2024). Coherent X‑ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth. ACS Nano, 18(3), 1982–1994. https://doi.org/10.1021/acsnano.3c07619

Chicago

Myint, Peco, Jeffrey M. Woodward, Chenyu Wang, Xiaozhi Zhang, Lutz Wiegart, Andrei Fluerasu, Randall L. Headrick, Charles R. Eddy Jr., and Karl F. Ludwig Jr. 2024. “Coherent X‑ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth.” ACS Nano 18 (3): 1982–94. doi:10.1021/acsnano.3c07619.