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Interfacial Crack Growth-Based Fatigue Lifetime Prediction of Thermoelectric Modules under Thermal Cycling.

Authors :
Zhang, Yuqian
He, Hailong
Niu, Chunping
Wu, Yi
Liu, Mengmeng
Liu, Shichao
Liu, Yang
Wu, Chunyu
Rong, Mingzhe
Source :
ACS Applied Materials & Interfaces; 1/10/2024, Vol. 16 Issue 1, p1137-1147, 11p
Publication Year :
2024

Details

Language :
English
ISSN :
19448244
Volume :
16
Issue :
1
Database :
Supplemental Index
Journal :
ACS Applied Materials & Interfaces
Publication Type :
Academic Journal
Accession number :
174764172
Full Text :
https://doi.org/10.1021/acsami.3c16436