Insights into the Semiconductor SERS Activity: The Impact of the Defect-Induced Energy Band Offset and Electron Lifetime Change.

Details

Language :

English

ISSN :

19448244

Volume :

15

Issue :

35

Database :

Supplemental Index

Journal :

ACS Applied Materials & Interfaces

Publication Type :

Academic Journal

Accession number :

171808561

Full Text :

https://doi.org/10.1021/acsami.3c06363