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Mapping Nanoscale Electrostatic Field Fluctuations around Graphene Dislocation Cores Using Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM).

Authors :
Coupin, Matthew J.
Wen, Yi
Lee, Sungwoo
Saxena, Anshul
Ophus, Colin
Allen, Christopher S.
Kirkland, Angus I.
Aluru, Narayana R.
Lee, Gun-Do
Warner, Jamie H.
Source :
Nano Letters; 8/9/2023, Vol. 23 Issue 15, p6807-6814, 8p
Publication Year :
2023

Details

Language :
English
ISSN :
15306984
Volume :
23
Issue :
15
Database :
Supplemental Index
Journal :
Nano Letters
Publication Type :
Academic Journal
Accession number :
169877618
Full Text :
https://doi.org/10.1021/acs.nanolett.3c00328