A Critical Review of Thermal Boundary Conductance across Wide and Ultrawide Bandgap Semiconductor Interfaces.

Details

Language :

English

ISSN :

19448244

Volume :

15

Issue :

25

Database :

Supplemental Index

Journal :

ACS Applied Materials & Interfaces

Publication Type :

Academic Journal

Accession number :

164613248

Full Text :

https://doi.org/10.1021/acsami.3c02507