Back to Search
Start Over
In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices.
In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices.
- Source :
- Journal of the Korean Physical Society; Jan2023, Vol. 82 Issue 2, p204-208, 5p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 03744884
- Volume :
- 82
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Journal of the Korean Physical Society
- Publication Type :
- Academic Journal
- Accession number :
- 161580741
- Full Text :
- https://doi.org/10.1007/s40042-022-00692-8