Narrow-area average method for measurement of the propagation length of surface plasmon polaritons using nanoslit-grating structures.

[Display omitted] • A method using nanoslit-grating structures was proposed to measure the propagation length of SPPs. • A model for performing quantitative measurements was established. • The standard deviation of the proposed method can be as small as 2.33% of its mean value. • The measurement error of the proposed method in measuring the intensity ratio can be smaller than 2% of its theoretical value. The propagation attenuation of surface plasmon polaritons (SPPs) has an important impact on the performance of plasmonic devices, so measuring their propagation length is important for designing plasmonic devices. Here we propose a method using a single nanoslit surrounded on both sides by surface gratings to measure the propagation length of SPPs. In this method, the propagation length of SPPs is obtained by using a narrow-area statistical averaging method to process the data of the intensity ratio of two diffracted light waves, which are converted from two SPPs that have the same initial intensity but travel different distances in opposite directions in a narrow area of a surface of a metal film. We demonstrate experimentally that at the illumination wavelength of 632.8 nm, the mean value of the propagation length of SPPs propagating at the interface between the air and a gold film with a thickness of about 360 nm measured using the proposed method is 9.88 μm, with a standard deviation of 0.23 μm (i.e., 2.33 % of the mean value). In addition, we demonstrate experimentally that the measurement error of the proposed method in measuring the intensity ratio of the two diffracted light waves, which is the dominant error of the proposed method in measuring the propagation length of SPPs, can be smaller than 2 % of its theoretical value. [ABSTRACT FROM AUTHOR]