Leveraging genetic algorithm to address multi-failure localization in optical networks.

Fault management has long been an indispensable component for controlling and managing telecommunication networks. To prevent huge data losses, it is necessary to develop a fast and efficient fault localization mechanism. In this work, we study the problem of multi-failure localization in transparent optical networks. In this context, a correlation-based approach is introduced to exploit the quality of transmission of acquired lightpaths to localize the faulty links. The proposed search-based framework can be implemented by leveraging any search algorithm. One may utilize the exhaustive search method to localize faulty links more accurately, but at the cost of taking more time. On the other hand, one may utilize intelligent search methods with the aim of reducing the required time for localization at the expense of accuracy. However, we propose to use both of the search approaches together. In this way, faulty links are first localized by the intelligent search methods to reroute and restore the failed traffic as fast as possible to prevent further loss of data. To this aim, a genetic algorithm (GA) is proposed to search among the suspected links. Subsequently, exhaustive search method can be utilized to localize failures more accurately without time constraint and then send technicians to the right site to recover the faulty links. The obtained results reveal that the proposed GA approach achieves overall high localization accuracy (98.6%–100%) that is insignificantly affected as the traffic load decreases. Dual and triple-failure incidents are localized within 42–80 ms and 596–2180 ms, respectively. It is shown that the mean time required for localizing failures using the GA search algorithm is significantly lower than exhaustive search approach by several orders of magnitude. Hence, the proposed GA-based fault localization algorithm can reduce the average time required to restore the traffic in case of failures, applicable for the restoration applications. [ABSTRACT FROM AUTHOR]