Correction to Electrostatic Discovery Atomic Force Microscopy.

MLA

Oinonen, Niko, et al. “Correction to Electrostatic Discovery Atomic Force Microscopy.” ACS Nano, vol. 16, no. 9, Sept. 2022, p. 15496. EBSCOhost, https://doi.org/10.1021/acsnano.2c08130.

APA

Oinonen, N., Xu, C., Alldritt, B., Hapala, P., Canova, F. F., Urtev, F., Cai, S., Krejčí, O., Kannala, J., Liljeroth, P., & Foster, A. S. (2022). Correction to Electrostatic Discovery Atomic Force Microscopy. ACS Nano, 16(9), 15496. https://doi.org/10.1021/acsnano.2c08130

Chicago

Oinonen, Niko, Chen Xu, Benjamin Alldritt, Prokop Hapala, Filippo Federici Canova, Fedor Urtev, Shuning Cai, et al. 2022. “Correction to Electrostatic Discovery Atomic Force Microscopy.” ACS Nano 16 (9): 15496. doi:10.1021/acsnano.2c08130.