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Counting Point Defects at Nanoparticle Surfaces by Electron Holography.

Authors :
Lu, Yan
Zheng, Fengshan
Lan, Qianqian
Schnedler, Michael
Ebert, Philipp
Dunin-Borkowski, Rafal E.
Source :
Nano Letters; 9/14/2022, Vol. 22 Issue 17, p6936-6941, 6p
Publication Year :
2022

Details

Language :
English
ISSN :
15306984
Volume :
22
Issue :
17
Database :
Supplemental Index
Journal :
Nano Letters
Publication Type :
Academic Journal
Accession number :
159144306
Full Text :
https://doi.org/10.1021/acs.nanolett.2c01510