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Surface Roughness: A Crucial Factor To Robust Electric Double Layer Capacitors.

Authors :
Wei, Jishi
Li, Yongbin
Dai, Dongmei
Zhang, Fengtao
Zou, Hongli
Yang, Xiaoxiao
Ji, Yahui
Li, Bao
Wei, Xianjun
Source :
ACS Applied Materials & Interfaces; 2/5/2020, Vol. 12 Issue 5, p5786-5792, 7p
Publication Year :
2020

Details

Language :
English
ISSN :
19448244
Volume :
12
Issue :
5
Database :
Supplemental Index
Journal :
ACS Applied Materials & Interfaces
Publication Type :
Academic Journal
Accession number :
155917212
Full Text :
https://doi.org/10.1021/acsami.9b18799