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Large Increase in the Dielectric Constant and Partial Loss of Coherence Increases Tunneling Rates across Molecular Wires.

Authors :
Chen, Xiaoping
Salim, Teddy
Zhang, Ziyu
Yu, Xiaojiang
Volkova, Ira
Nijhuis, Christian A.
Source :
ACS Applied Materials & Interfaces; 10/7/2020/, Vol. 12 Issue 40, p45111-45121, 11p
Publication Year :
2020

Details

Language :
English
ISSN :
19448244
Volume :
12
Issue :
40
Database :
Supplemental Index
Journal :
ACS Applied Materials & Interfaces
Publication Type :
Academic Journal
Accession number :
146339899
Full Text :
https://doi.org/10.1021/acsami.0c11106