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Nanoimaging of Electrical Failure in VO2 Resistive-Switching Nanodevices.
- Source :
- ACS Applied Electronic Materials; 8/25/2020, Vol. 2 Issue 8, p2357-2362, 6p
- Publication Year :
- 2020
Details
- Language :
- English
- ISSN :
- 26376113
- Volume :
- 2
- Issue :
- 8
- Database :
- Supplemental Index
- Journal :
- ACS Applied Electronic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 145317064
- Full Text :
- https://doi.org/10.1021/acsaelm.0c00382