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Vertical MoS2 Double-Layer Memristor with Electrochemical Metallization as an Atomic-Scale Synapse with Switching Thresholds Approaching 100 mV.

Authors :
Xu, Renjing
Jang, Houk
Lee, Min-Hyun
Amanov, Dovran
Cho, Yeonchoo
Kim, Haeryong
Park, Seongjun
Shin, Hyeon-jin
Ham, Donhee
Source :
Nano Letters; Apr2019, Vol. 19 Issue 4, p2411-2417, 7p
Publication Year :
2019

Details

Language :
English
ISSN :
15306984
Volume :
19
Issue :
4
Database :
Supplemental Index
Journal :
Nano Letters
Publication Type :
Academic Journal
Accession number :
145010138
Full Text :
https://doi.org/10.1021/acs.nanolett.8b05140