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Mechanisms Responsible for High Energy Radiation Induced Damage to Single-Stranded DNA Modified by Radiosensitizing 5-Halogenated Deoxyuridines.

Authors :
Shoushan Wang
Peiwen Zhao
Changzhe Zhang
Yuxiang Bu
Source :
Journal of Physical Chemistry B; Mar2016, Vol. 120 Issue 10, p2649-2657, 9p
Publication Year :
2016

Details

Language :
English
ISSN :
15206106
Volume :
120
Issue :
10
Database :
Supplemental Index
Journal :
Journal of Physical Chemistry B
Publication Type :
Academic Journal
Accession number :
114316926
Full Text :
https://doi.org/10.1021/acs.jpcb.5b11432