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Nanopillar Fabrication with Focused Ion Beam Cutting.

Authors :
Kuzmin, Oleksii V.
Pei, Yutao T.
De Hosson, Jeff T.M.
Source :
Microscopy & Microanalysis; Oct2014, Vol. 20 Issue 5, p1581-1584, 4p
Publication Year :
2014

Details

Language :
English
ISSN :
14319276
Volume :
20
Issue :
5
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
98554882
Full Text :
https://doi.org/10.1017/S1431927614001032