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Assessing attachment in the school years: The application of the Dynamic Maturational Model of Attachment to the coding of a child attachment interview with community and looked-after children.

Authors :
Farnfield, Steve
Source :
Clinical Child Psychology & Psychiatry; Oct2014, Vol. 19 Issue 4, p516-534, 19p
Publication Year :
2014

Abstract

Background: This article reports on the analysis of a Child Attachment Interview using the Dynamic Maturational Model (DMM) of attachment coding system developed by Crittenden for use with the Adult Attachment Interview (AAI). The aim of the study was to see if the two coders could classify the child interviews using the DMM-AAI approach and produce the range of DMM attachment strategies to be expected from previous research and the literature. Methods: Two coders independently classified interviews with 41 children aged between 6 and 13 years with an average age of 9.8 years. In total, 24 of the children were from a local authority middle school (the community children) and 17 were in foster care (looked-after children). Results: The full array of DMM strategies was identified, with significant differences between the community and looked-after children in terms of attachment security and lack of resolution of loss and trauma. There was 100% agreement between coders on secure versus insecure attachment patterns, a Kappa of .910 for the full range of DMM attachment strategies and Kappas of between .655 and .773 for unresolved loss, trauma and depression. Discussion focuses on the strengths and deficits of the use of the DMM compared with other published work on child attachment interviews, the use of interviews to assess post-traumatic stress disorder in children and the implications of defensive attachment strategies for services offered to looked-after children. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13591045
Volume :
19
Issue :
4
Database :
Complementary Index
Journal :
Clinical Child Psychology & Psychiatry
Publication Type :
Academic Journal
Accession number :
98516474
Full Text :
https://doi.org/10.1177/1359104514520758