A single-photon avalanche diode test chip in 150nm CMOS technology.

Authors :: Pancheri, Lucio
Dalla Betta, Gian-Franco
Campos Braga, Leo Huf
Xu, Hesong
Stoppa, David
Source :: 2014 International Conference on Microelectronic Test Structures (ICMTS); 2014, p161-164, 4p
Publication Year :: 2014

Language :: English
ISBNs :: 9781479921935
Database :: Complementary Index
Journal :: 2014 International Conference on Microelectronic Test Structures (ICMTS)
Publication Type :: Conference
Accession number :: 98459959
Full Text :: https://doi.org/10.1109/ICMTS.2014.6841486