Measurement of N in High Z Substrate Using Non-Rutherford Backscattering.

Details

Language :

English

ISSN :

0256307X

Volume :

9

Issue :

4

Database :

Complementary Index

Journal :

Chinese Physics Letters

Publication Type :

Academic Journal

Accession number :

98346605

Full Text :

https://doi.org/10.1088/0256-307X/9/4/003