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Mean field approach for describing thin film morphology.

Authors :
Tomellini, M.
Fanfoni, M.
Source :
Journal of Physics: Condensed Matter; 5/3/2006, Vol. 18 Issue 17, p1-1, 1p
Publication Year :
2006

Details

Language :
English
ISSN :
09538984
Volume :
18
Issue :
17
Database :
Complementary Index
Journal :
Journal of Physics: Condensed Matter
Publication Type :
Academic Journal
Accession number :
98242989
Full Text :
https://doi.org/10.1088/0953-8984/18/17/010